SN74BCT8374ADWRG4 Datasheet(PDF) - Texas Instruments

IC SCAN TEST DEVICE 24SOIC
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC

Related Products

# Part Number Description Manufacturer
1 LBBMB8SM ACCY MIRROR MNT 3/4 58A SMAM Laird Technologies IAS
2 HMC606LC5 IC AMP LOW PHASE NOISE 32SMDRF Amplifier IC General Purpose 2GHz ~ 18GHz 32-CSMT (5x5) Analog Devices Inc.
3 TX2-L2-5V RELAY TELECOM DPDT 2A 5VTelecom Relay DPDT (2 Form C) Through Hole Panasonic Electric Works
4 PCJ-112D3M,301 RELAY GEN PURPOSE SPST 3A 12VGeneral Purpose Relay SPST-NO (1 Form A) 12VDC Coil Through Hole TE Connectivity Potter & Brumfield Relays
5 SDT-SS-112DM,000 RELAY GEN PURPOSE SPST 10A 12VGeneral Purpose Relay SPST-NO (1 Form A) 12VDC Coil Through Hole TE Connectivity Potter & Brumfield Relays
6 MY2N AC220/240 (S) RELAY GEN PURPOSE DPDT 5A 240VGeneral Purpose Relay DPDT (2 Form C) 240VAC Coil Socketable Omron Automation and Safety
7 24A243 SOCKET CLIP F/SAFETY RELAYClip, Hold Down SR6 Series Sockets TE Connectivity Potter & Brumfield Relays
8 ARA220A12 RELAY RF DPDT 1A 12V Panasonic Electric Works
9 70M-ODC24B OUTPUT MODULE DC MINI 9MA 24VDCDC Output Module Output Module 0.02 ~ 3A 3 ~ 60VDC Output 24VDC (15 ~ 30VDC) Supply Grayhill Inc.
Top