SN74BCT8374ANT Datasheet(PDF) - Texas Instruments

IC SCAN TEST DEVICE W/FF 24-DIP
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-PDIP

Related Products

# Part Number Description Manufacturer
1 HY1Z-4.5V RELAY TELECOM SPDT 1A 4.5VTelecom Relay SPDT (1 Form C) Through Hole Panasonic Electric Works
2 RSN116130 2,4 POLE/10 AMP, 3 POLE/25 AMP,Relay Amphenol Pcd
3 RSL116141 MCDONNEL DOUGLASRelay Amphenol Pcd
4 JS1-F-6V-F RELAY GEN PURPOSE SPDT 10A 6VGeneral Purpose Relay SPDT (1 Form C) 6VDC Coil Through Hole Panasonic Electric Works
5 RYA32005 RELAY GENERAL PURPOSE SPST 8A 5VGeneral Purpose Relay SPST-NO (1 Form A) 5VDC Coil Through Hole TE Connectivity Potter & Brumfield Relays
6 70MRCK16-HS I/O MOUNTING BOARD MINI 16POSI/O Module Rack 16 Channel Grayhill Inc.
7 C4ODC OUTPUT MODULE DC C4 16MA 4-32VDCDC Output Module Output Module 0.01 ~ 3A 5 ~ 60VDC Output 4 ~ 32VDC Supply Sensata-Crydom
8 70G-IDC5NP INPUT MODULE AC/DC 18MA 5VDCAC/DC Input Module Output Module 10mA 5VDC Output 15 ~ 32VAC, 10 ~ 32VDC Supply Grayhill Inc.
9 JSM1-12V-4 RELAY AUTOMOTIVE SPDT 10A 12V Panasonic Electric Works
Top