SN74BCT8374ANTG4 Datasheet(PDF) - Texas Instruments

IC SCAN TEST DEVICE W/FF 24-DIP
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-PDIP

Related Products

# Part Number Description Manufacturer
1 CB-ACC-73 CC DEBUGGER ADAPTER BOARD connectBlue
2 TX2SS-3V-Z RELAY TELECOM DPDT 2A 3VTelecom Relay DPDT (2 Form C) Surface Mount Panasonic Electric Works
3 25622077 CONTROL TIMER ACCESS SOCKET 11PCONTROL TIMER ACCESS SOCKET 11P Crouzet
4 RSE116627-S STAINLESS STEEL ALTERNATIVERelay Amphenol Pcd
5 2-1904045-5 V23333Z1001B045-EV-311Relay TE Connectivity Potter & Brumfield Relays
6 G7L-2A-T-J-CB-AC100/120 RELAY GEN PURPOSE DPST 25A 120VGeneral Purpose Relay DPST-NO (2 Form A) 120VAC Coil Chassis Mount Omron Electronics Inc-EMC Div
7 2976420 VARIOFACE OUTPUT MODULE 8CHI/O Module Rack 8 Channel Phoenix Contact
8 ODC-24 OUTPUT MODULE DC STD 13MA 24VDCDC Output Module Output Module 0.01 ~ 3A 3 ~ 60VDC Output 24VDC (18 ~ 32VDC) Supply Sensata-Crydom
9 DRC3P48D411R 480V 5A 24VAC/DC 1NO+1NC RN 3L Sensata-Crydom
Top